XPS and Auger spectroscopy studies on mixtures of the oxides SiO₂, Al₂O₃, Fe₂O₃, and C₁₂O₃PAPARAZZO, E.Journal of electron spectroscopy and related phenomena. 1987, Vol 43, Num 2, pp 97-112, issn 0368-2048Article

Reflected electron energy-loss microscopy and scanning Auger microscopy study of semiconductor surfacesPAPARAZZO, E.Surface and interface analysis. 1997, Vol 25, Num 4, pp 235-244, issn 0142-2421Article

Synchrotron radiation photoemission and scanning Auger microprobe study of hydrated silicaPAPARAZZO, E.Applied surface science. 1993, Vol 72, Num 4, pp 313-319, issn 0169-4332Conference Paper

XPS studies of damage induced by X-ray irradiation on CeO₂ surfacesPAPARAZZO, E.Surface science. 1990, Vol 234, Num 1-2, pp L253-L258, issn 0039-6028Article

XPS analysis of iron aluminum oxide systemsPAPARAZZO, E.Applied surface science. 1986, Vol 25, Num 1-2, pp 1-12, issn 0169-4332Article

Surface and interface analysis of a Roman lead pipe fistula : microchemistry of the soldering at the joint, as seen by scaning Auger microscopy and X-ray photoelectron spectroscopyPAPARAZZO, E.Applied surface science. 1994, Vol 74, Num 1, pp 61-72, issn 0169-4332Article

Synchrotron radiation photoemission and X-ray photoelectron spectroscopy studies of argon ion etched SiO₂ surfacesPAPARAZZO, E.Journal of electron spectroscopy and related phenomena. 1990, Vol 50, Num 1-2, pp 47-52, issn 0368-2048Article

X-ray photo-emission and Auger spectra of damage induced by Ar⁺-ion etching at SiO₂ surfacesPAPARAZZO, E.Journal of physics. D, Applied physics (Print). 1987, Vol 20, Num 8, pp 1091-1094, issn 0022-3727Article

XPS analysis of iron aluminum oxide systemsPAPARAZZO, E.Applied surface science. 1986, Vol 25, Num 1-2, pp 1-12, issn 0169-4332Article

Reflected electron energy loss microscopy and scanning Auger microscopy studies of electron irradiated alkali halide surfacesPAPARAZZO, E; ZEMA, N.Surface science. 1997, Vol 372, Num 1-3, pp L301-L308, issn 0039-6028Article

AN XPS AND MOESSBAUER STUDY OF THE ELECTRONIC PROPERTIES OF ZNCR_XGA_2-XO₄ SPINEL SOLID SOLUTIONSBATTISTONI C; DORMANN JL; FIORANI D et al.1981; SOLID STATE COMMUN.; ISSN 0038-1098; USA; DA. 1981; VOL. 39; NO 4; PP. 581-585; BIBL. 24 REF.Article

X-ray photoelectron spectroscopy and scanning Auger microscopy studies of bronzes from the collections of the Vatican Museums = Etudes par spectroscopie X et microscopie électronique à balayage Auger de bronzes des collections des musées du VaticanPAPARAZZO, E; MORETTO, L.Vacuum. 1999, Vol 55, Num 1, pp 59-70, issn 0042-207XArticle

STUDIO DELLO STRATO DI PASSIVAZIONE CROMICA DELLA BANDA STAGNATA MEDIANTE INDAGINI ELETTROCHIMICHE E ANALISI XPS (ESCA) = INVESTIGATION OF THE FILM OF CHROMIC PASSIVATION OF A TIN COATED STRIP BY MEANS OF ELECTROCHEMICAL STUDY AND A PHOTOELECTRON SPECTROSCOPIC ANALYSIS = ETUDE DU FILM DE PASSIVATION CHROMIQUE D'UNE BANDE ETAMEE A L'AIDE D'UNE RECHERCHE ELECTROCHIMIQUE ET D'UNE ANALYSE PAR SPECTROSCOPIE DE PHOTO-ELECTRONSAZZERRI N; SPLENDORINI L; BATTISTONI C et al.1983; BOLL. TEC. FINSIDER; ISSN 0391-7266; ITA; DA. 1983; NO 396; PP. 35-45; BIBL. 60 REF.Article

X-RAY PHOTOELECTRON SPECTROSCOPY AND ELECTROCHEMICAL ANALYSIS OF PASSIVATED ELECTROLYTIC TIN PLATE SURFACES = SPECTROSCOPIE PHOTOELECTRONIQUE RX ET ANALYSE ELECTROCHIMIQUE DES DEPOTS ELECTROLYTIQUES DE SN PASSIVESAZZERRI N; SPLENDORINI L; BATTISTONI C et al.1982; SURF. TECHNOL.; ISSN 0376-4583; CHE; DA. 1982; VOL. 15; NO 3; PP. 255-275; BIBL. 60 REF.Article

THE ELECTRONIC STRUCTURE OF RN₂S₂^- LIGANDS FROM XPS(ESCA) SPECTRA OF SOME NICKEL (II) COMPLEXES.BOSSA M; FURLANI C; MATTOGNO G et al.1978; INORG. CHIM. ACTA; ITAL.; DA. 1978; VOL. 27; NO 2; PP. L117-L118; BIBL. 8 REF.Article

Surface composition of Fe-Al₂O₃ granular thin films by X-ray photoemission spectoscopyPAPARAZZO, E; DORMANN, J. L; FIORANI, D et al.Journal of electron spectroscopy and related phenomena. 1985, Vol 36, Num 1, pp 77-91, issn 0368-2048Article

Comment on structure of α-Fe₂O₃ single crystal surfaces following Ar⁺ ion bombardment and annealing in O₂. ReplyPAPARAZZO, E; LAD, R. J; HENRICH, V. E et al.Surface science. 1988, Vol 200, Num 1, pp L470-L472, issn 0039-6028Article

Quantitative surface analysis by XPS: a comparison among different quantitative approachesBATTISTONI, C; MATTOGNO, G; PAPARAZZO, E et al.Surface and interface analysis. 1985, Vol 7, Num 3, pp 117-121, issn 0142-2421Article

Spin-glass like behaviour in a concentrated chromium spinel: Zn_0.5Cd_0.5Cr₂S₄AGOSTINELLI, E; FILACI, P; FIORANI, D et al.Solid state communications. 1985, Vol 56, Num 6, pp 541-543, issn 0038-1098Article

X-ray photoemission study of Fe-Al₂O₃ granular thin filmsPAPARAZZO, E; DORMANN, J. L; FIORANI, D et al.Physical review. B, Condensed matter. 1983, Vol 28, Num 2, pp 1154-1157, issn 0163-1829Article

Auger electron spectroscopy (AES) and electron energy loss spectroscopy (EELS) studies of GaP and Si surfacesPAPARAZZO, E; MORETTO, L; BROLATTI, Massimo et al.Vacuum. 2002, Vol 65, Num 2, pp 193-206, issn 0042-207XArticle

Comment on: AES and SAM microanalysis of structure ceramics by thinning and coating the backside. Authors' replyPAPARAZZO, E; LING YU; DELING JIN et al.Surface and interface analysis. 2001, Vol 31, Num 12, pp 1110-1113, issn 0142-2421Article

An XPS and Auger study of some polynuclear copper compoundsBATTISTONI, C; MATTOGNO, G; PAPARAZZO, E et al.Inorganica chimica acta. 1985, Vol 102, Num 1, pp 1-3, issn 0020-1693Article

X-ray photoemission spectroscopy (XPS) analysis of Fe₈₂B₁₈-Al₂O₃ granular systems = Analyse de spectroscopie de photoémission RX (XPS) des systèmes granulaires Fe₈₂B₁₈-Al₂O₃PAPARAZZO, E; DORMANN, J. L; FIORANI, D et al.Solid state communications. 1984, Vol 50, Num 10, pp 919-923, issn 0038-1098Article

Surface quantitative analysis of Cr-O systems by XPSBATTISTONI, C; COSSU, G; MATTOGNO, G et al.Surface and interface analysis. 1983, Vol 5, Num 4, pp 173-176, issn 0142-2421Article